e/Low-energy electron microscopy

Information
has gloss	eng: Low-energy electron microscopy, or LEEM, is an analytical surface science technique invented by Ernst Bauer in 1962, however, not fully developed (by Ernst Bauer and Wolfgang Telieps) until 1985. LEEM is a technique used by surface scientists image atomically clean surfaces, atom-surface interactions, and thin (crystalline) films. In LEEM, high-energy electrons (15-20 keV) are emitted from an electron gun, focused using a set of condenser optics, and sent through a magnetic beam deflector (usually 60˚ or 90˚). The “fast” electrons travel through an objective lens and begin decelerating to low energies (1-100 eV) near the sample surface because the sample is held at a potential near that of the gun. The low-energy electrons are now termed “surface-sensitive” and the near-surface sampling depth can be varied by tuning the energy of the incident electrons (difference between the sample and gun potentials minus the work functions of the sample and system).
lexicalization	eng: Low energy electron microscopy
lexicalization	eng: Low-Energy Electron Microscopy
instance of	(noun) magnifier of the image of small objects; "the invention of the microscope led to the discovery of the cell" microscope

Meaning
German
has gloss	deu: Das niederenergetische Elektronenmikroskop ist ein Gerät zur Untersuchung von Oberflächenstrukturen mittels Elektronen, das von Ernst Bauer schon 1962 erfunden wurde, aber erst 1985 vollständig entwickelt gewesen ist. Mit seiner Hilfe können atomar glatte Oberflächen, Atom-Oberflächen-Wechselwirkungen und dünne (kristalline) Filme mikroskopiert werden.
lexicalization	deu: Niederenergetisches Elektronenmikroskop
Turkish
has gloss	tur: Düşük enerjili elektron mikroskobu, veya LEEM (Low Energy Electron Microscope), maddelerin yüzeylerini mezoskopik boyutlarda incelemeye yarayan bir elektron mikroskobu çesididir. Elastik olarak yüzeyden geri saçılan düşük enerjili (0-500 elektronvolt) elektronların görüntülenmesi üzerine kuruludur. Yüzeylerin yapısal ve kimyasal özelliklerinin 10 nanometreye varan bir çözünürlükte incelenmesini sağlar. İnce filimler, katalitik yüzeyler, nanoteknolojik sistemler ile ilgili çalışmalardaki öneminin ötesinde, bu mikroskoptaki yüksek sinyal seviyeleri yüzeydeki dinamik degişimleri video hızında canlı olarak takip etmeye olanak tanır.
lexicalization	tur: Düşük enerjili elektron mikroskobu

Media
media:img	Ag rods on Si.png
media:img	Cr(001).png
media:img	EwaldsphereLEED.png
media:img	LEED Lens and Ray Diagram.png
media:img	LEEM palladium on tungsten.jpg
media:img	UIUC LEEM.jpg