e/SILC (semiconductors)

Information
has gloss	eng: Stress Induced Leakage Current (SILC) is an increase in the gate leakage current of a MOSFET, due to defects created in the gate oxide during electrical stressing. SILC is perhaps the largest factor inhibiting device miniturization.
lexicalization	eng: SILC
instance of	(noun) a conductor made with semiconducting material semiconductor, semiconductor unit, semiconductor device